Metrohm NIRS XDS RapidContent Analyzer - Manual (Page 55)

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Noise Summary displayed using the OpQual tab.
The OpQual tab brings up the display shown. This shows results of the Noise Test for each of the four
wavelength regions. These regions are:
• 400-700nm
• 700-1100nm
• 1100-1700nm
• 1700-2500nm
For each region, results are given for
• Peak-to-Peak Noise (P-P)
• Root-Mean-Square Noise (RMS)
• Bias (A measure of baseline energy changes)
Each of these parameters is described in more detail in the Diagnostics Section of the Vision Manual.
If the test is reported as “Passed” the user may proceed with sample analysis.
The XDS instrument contains internal wavelength reference materials as a means to maintain
monochromator wavelength measurement. These internal wavelength materials are protected and
are moved by software command, transparent to the user. When Performance Test is run, the relative
wavelength positions and repeatability of these wavelength materials are monitored and reported.
Note that these internal wavelength materials may not measure precisely on the assigned nominals.
These nominals are arbitrary. The internal wavelength materials are a method to assure stable
readings on the external wavelength standard, measured at the sample plane.
7.2.2 Wavelength Certification
Wavelength Certification is used to confirm the peak positions of the instrument to a defined,
external wavelength standard.
Click on Diagnostics,
Wavelength Certification,
Run Wavelength
Certification.
The Number of Samples should be 10, as
shown.
The wavelength standard for reflectance is the
“SRM-1920 plus talc”, which refers to the
WSR1xxxx standard. This is the same cell used
for Instrument Calibration. Vision defaults to
this selection for the XDS RCA.
Click “OK” when ready.
Vision briefly requests that the user place the ceramic reference into position. This is automatic with
the Rapid Content Analyzer; no response is required.